SMART: A Machine Learning and Monte Carlo Framework for Rapid Analysis of Stochastic Transistor Aging and Process Variation in Digital Circuits
利用机器学习和蒙特卡洛方法快速分析数字电路随机晶体管老化和工艺变化,显著加速仿真速度
arXiv:2607.05187v1 Announce Type: new Abstract: As CMOS technology scales into the deep nanometer regime, digital circuit reliability is increasingly …