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Library-Aware Doubles and Iterative Repair for Large Language Model-Generated Unit Tests in OpenSIL Firmware
用LLM自动生成OpenSIL固件单元测试，结合库感知双打与迭代修复显著提升测试可靠性。
arXiv:2606.19725v1 Announce Type: cross Abstract: Validating changes in low-level C firmware is expensive because unit tests (UTs) are fragile under s…